Fast Abstracts online proceedings can be found here.

Fast Abstracts are short presentations of work in progress or opinion pieces (maximum 2 pages in the CPS 8.5"x11" two-column camera-ready format). Fast Abstracts aim to serve as a rapid and flexible mechanism to:

• Report on current work that may or may not be complete
• Introduce new ideas to the community
• State positions on controversial issues or open problems

Major Topics include, but are not limited to:

• Architectures and protocols for dependability and security;
• Dependability and security in various contexts;
• Modeling, monitoring, benchmarking, measurement, assessment, assurance, and evaluation;
• Adaptive and autonomous dependability and security;
• Fault and intrusion tolerance;
• Security, privacy, and safety policies;
• Critical infrastructure protection and survivability;
• Safety- and mission-critical systems;
• Social and psychological factors;
• Formal methods for dependability and security;
• Software engineering for dependability and security.

Contributions are welcome from academia and industry. A Fast Abstract must be submitted in its final form, ready to be printed. Fast Abstracts are limited to 2 pages. Submissions must be made electronically, in PDF format.

Fast Abstracts will be lightly screened. The criteria for acceptance will be: i) relevance and interest to the community, and ii) arrival time. Therefore, authors are encouraged to send their submission well in advance before the final deadline. We will accept as many Fast Abstracts as possible, but the number is limited by the available presentation time at the conference. By submitting a Fast Abstract, you are committing yourself or one of your colleagues to present it at the conference.

Submissions must be emailed directly to gtredan <at> laas.fr.
Please send a pdf document and start the mail subject by "[EDCC_FA]".

Submission deadline: July 28, 2016
Author Notification: August 12, 2016
Camera Ready: August 19, 2016

Fast Abstracts chair: Gilles Tredan, LAAS-CNRS, France

Fast Abstracts committee members:

• Yvonne Anne Pignolet, ABB Corporate Research, Switzerland
• Raul Barbosa, University of Coimbra, Portugal
• Erwan Le Merrer, Technicolor R&D, France